Riga Analytical Lab utilizes a combination
of analytical techniques to provide comprehensive and conclusive
evidence of failure mechanisms on semiconductor devices and
other electronic components.
and Metallurgical Failure Analysis
The laboratory performs electrical and structural analyses
on of a variety of devices with the objective of relating
electrical malfunctions to physical imperfections.
We utilize a Focused Ion Beam (FIB) system
not only for circuit modification but also as a tool to troubleshoot
electrically the device in conjunction with light emission,
hot spot detection, voltage contrast, EBIC and OBIC techniques.
For analysis of relatively simple devices,
we apply selective wet and dry etching and for more complex
devices we combine sequential stripback with parallel lapping
We integrate metallographic techniques
with probing and/or passive voltage contrast to monitor the
electrical performance of a particular structure in order
to identify and document a damage or defect.
The laboratory performs cross sections on a wide range of
devices including semiconductor and photonic packages, optical
fibers, complex printed circuit boards, and a variety of MEMS.
We perform geometric and material characterizations
by providing detailed photographic documentation so that any
micron or submicron structure can be reconstructed in three
dimensions. This process is complemented with specific material
analyses to gain a more comprehensive understanding of the
We analyze the materials utilized in the semiconductor industry
with the objective of identifying elements and characterizing
structures that influence the performance of the device and
These analyses include but are not limited
to silicon crystallographic imperfections, surface and interface
contamination, solder bump structures, etc.
The FIB system is utilized routinely to evaluate new layout
modifications prior to the implementation of the change in
the fabrication process, to correct layout problems, and to
place strategic test pads or windows that facilitate the analytical
troubleshooting of the circuits.
We can perform a limited number of MIL-STD
We have participated in a number of court
cases providing expert witness testimony based on our analytical